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AFID: an automated fault identification tool

Alex Edwards, Sean Tucker, Sébastien Worms, Rahul Vaidya, Brian Demsky. AFID: an automated fault identification tool. In Barbara G. Ryder, Andreas Zeller, editors, Proceedings of the ACM/SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2008, Seattle, WA, USA, July 20-24, 2008. pages 179-188, ACM, 2008. [doi]

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Alex Edwards

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Sean Tucker

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Sébastien Worms

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Rahul Vaidya

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Brian Demsky

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