Formal Test Point Insertion for Region-based Low-Capture-Power Compact At-Speed Scan Test

Stephan Eggersglüß, Stefan Holst, Daniel Tille, Kohei Miyase, Xiaoqing Wen. Formal Test Point Insertion for Region-based Low-Capture-Power Compact At-Speed Scan Test. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 173-178, IEEE Computer Society, 2016. [doi]

@inproceedings{EggersglussHTMW16,
  title = {Formal Test Point Insertion for Region-based Low-Capture-Power Compact At-Speed Scan Test},
  author = {Stephan Eggersglüß and Stefan Holst and Daniel Tille and Kohei Miyase and Xiaoqing Wen},
  year = {2016},
  doi = {10.1109/ATS.2016.41},
  url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2016.41},
  researchr = {https://researchr.org/publication/EggersglussHTMW16},
  cites = {0},
  citedby = {0},
  pages = {173-178},
  booktitle = {25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016},
  publisher = {IEEE Computer Society},
  isbn = {978-1-5090-3809-1},
}