Analysis of Mistakes as a Method to Improve Test Case Design

Sigrid Eldh, Hans Hansson, Sasikumar Punnekkat. Analysis of Mistakes as a Method to Improve Test Case Design. In IEEE Fourth International Conference on Software Testing, Verification and Validation, ICST 2011, Berlin, Germany, 21-25 March 2011. pages 70-79, IEEE Computer Society, 2011. [doi]

Authors

Sigrid Eldh

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Hans Hansson

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Sasikumar Punnekkat

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