Mahmoud A. Elmohr, Haohao Liao, Catherine H. Gebotys. EM Fault Injection on ARM and RISC-V. In 21st International Symposium on Quality Electronic Design, ISQED 2020, Santa Clara, CA, USA, March 25-26, 2020. pages 206-212, IEEE, 2020. [doi]
@inproceedings{ElmohrLG20,
title = {EM Fault Injection on ARM and RISC-V},
author = {Mahmoud A. Elmohr and Haohao Liao and Catherine H. Gebotys},
year = {2020},
doi = {10.1109/ISQED48828.2020.9137051},
url = {https://doi.org/10.1109/ISQED48828.2020.9137051},
researchr = {https://researchr.org/publication/ElmohrLG20},
cites = {0},
citedby = {0},
pages = {206-212},
booktitle = {21st International Symposium on Quality Electronic Design, ISQED 2020, Santa Clara, CA, USA, March 25-26, 2020},
publisher = {IEEE},
isbn = {978-1-7281-4207-4},
}