Dustin Luis Espinosa-Isidrón, Edel B. García Reyes. A New Dissimilarity Measure for Trajectories with Applications in Anomaly Detection. In Isabelle Bloch, Roberto M. Cesar, editors, Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications - 15th Iberoamerican Congress on Pattern Recognition, CIARP 2010, Sao Paulo, Brazil, November 8-11, 2010. Proceedings. Volume 6419 of Lecture Notes in Computer Science, pages 193-201, Springer, 2010. [doi]
@inproceedings{Espinosa-IsidronR10,
title = {A New Dissimilarity Measure for Trajectories with Applications in Anomaly Detection},
author = {Dustin Luis Espinosa-Isidrón and Edel B. García Reyes},
year = {2010},
doi = {10.1007/978-3-642-16687-7_29},
url = {http://dx.doi.org/10.1007/978-3-642-16687-7_29},
researchr = {https://researchr.org/publication/Espinosa-IsidronR10},
cites = {0},
citedby = {0},
pages = {193-201},
booktitle = {Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications - 15th Iberoamerican Congress on Pattern Recognition, CIARP 2010, Sao Paulo, Brazil, November 8-11, 2010. Proceedings},
editor = {Isabelle Bloch and Roberto M. Cesar},
volume = {6419},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-642-16686-0},
}