Increasing the Dependability of VLSI Systems through Early Detection of Fugacious Faults - researchr publication authors

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Jaime Espinosa, David de Andrés, Pedro J. Gil. Increasing the Dependability of VLSI Systems through Early Detection of Fugacious Faults. In 11th European Dependable Computing Conference, EDCC 2015, Paris, France, September 7-11, 2015. pages 190-197, IEEE, 2015. [doi]

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