Corner detection using slit rotational edge-feature detector

Yasutaka Etou, Takahiro Sugiyama, Keiichi Abe, Toru Abe. Corner detection using slit rotational edge-feature detector. In ICIP (1). pages 797-800, 2002.

Authors

Yasutaka Etou

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Takahiro Sugiyama

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Keiichi Abe

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Toru Abe

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