Mike Fabish. A Strategy for Enhancing Fault Coverage on VLSI Circuit Boards Using Performance In-Circuit Test Techniques. In Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986. pages 312-316, IEEE Computer Society, 1986.
@inproceedings{Fabish86,
title = {A Strategy for Enhancing Fault Coverage on VLSI Circuit Boards Using Performance In-Circuit Test Techniques},
author = {Mike Fabish},
year = {1986},
tags = {test coverage, testing, coverage},
researchr = {https://researchr.org/publication/Fabish86},
cites = {0},
citedby = {0},
pages = {312-316},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986},
publisher = {IEEE Computer Society},
}