Craig C. F. Fahrenkrug, Linda M. Head. Instrumentation effects on the detection of resistance transients during accelerated testing of VLSI interconnects. IEEE T. Instrumentation and Measurement, 49(4):716-720, 2000. [doi]
@article{FahrenkrugH00,
title = {Instrumentation effects on the detection of resistance transients during accelerated testing of VLSI interconnects},
author = {Craig C. F. Fahrenkrug and Linda M. Head},
year = {2000},
doi = {10.1109/19.863912},
url = {http://dx.doi.org/10.1109/19.863912},
researchr = {https://researchr.org/publication/FahrenkrugH00},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {49},
number = {4},
pages = {716-720},
}