Craig C. F. Fahrenkrug, Linda M. Head. Instrumentation effects on the detection of resistance transients during accelerated testing of VLSI interconnects. IEEE T. Instrumentation and Measurement, 49(4):716-720, 2000. [doi]
@article{FahrenkrugH00, title = {Instrumentation effects on the detection of resistance transients during accelerated testing of VLSI interconnects}, author = {Craig C. F. Fahrenkrug and Linda M. Head}, year = {2000}, doi = {10.1109/19.863912}, url = {http://dx.doi.org/10.1109/19.863912}, researchr = {https://researchr.org/publication/FahrenkrugH00}, cites = {0}, citedby = {0}, journal = {IEEE T. Instrumentation and Measurement}, volume = {49}, number = {4}, pages = {716-720}, }