Marco Faifer, Christian Laurano, Roberto Ottoboni, Sergio Toscani, Michele Zanoni, Roberto Ferrero. Simple skin effect compensation in cylindrical shunts. In 2016 IEEE International Workshop on Applied Measurements for Power Systems (AMPS), Aachen, Germany, September 28-30, 2016. pages 1-6, IEEE, 2016. [doi]
@inproceedings{FaiferLOTZF16,
title = {Simple skin effect compensation in cylindrical shunts},
author = {Marco Faifer and Christian Laurano and Roberto Ottoboni and Sergio Toscani and Michele Zanoni and Roberto Ferrero},
year = {2016},
url = {https://www.wikidata.org/entity/Q58804795},
researchr = {https://researchr.org/publication/FaiferLOTZF16},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {2016 IEEE International Workshop on Applied Measurements for Power Systems (AMPS), Aachen, Germany, September 28-30, 2016},
publisher = {IEEE},
isbn = {978-1-5090-2373-8},
}