Shu-Kai S. Fan, Yu-Chiang Chuang. Automatic detection of Mura defect in TFT-LCD based on regression diagnostics. Pattern Recognition Letters, 31(15):2397-2404, 2010. [doi]
@article{FanC10-1,
title = {Automatic detection of Mura defect in TFT-LCD based on regression diagnostics},
author = {Shu-Kai S. Fan and Yu-Chiang Chuang},
year = {2010},
doi = {10.1016/j.patrec.2010.07.013},
url = {http://dx.doi.org/10.1016/j.patrec.2010.07.013},
tags = {rule-based, model-based diagnostics, meta-model, diagnostics, Meta-Environment},
researchr = {https://researchr.org/publication/FanC10-1},
cites = {0},
citedby = {0},
journal = {Pattern Recognition Letters},
volume = {31},
number = {15},
pages = {2397-2404},
}