Fine-Grained Multi-Instance Classification in Microscopy Through Deep Attention - researchr publication authors

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Mengran Fan, Tapabrata Chakraborti, Eric I-Chao Chang, Yan Xu, Jens Rittscher. Fine-Grained Multi-Instance Classification in Microscopy Through Deep Attention. In 17th IEEE International Symposium on Biomedical Imaging, ISBI 2020, Iowa City, IA, USA, April 3-7, 2020. pages 169-173, IEEE, 2020. [doi]

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