Yu Fan, David Houle, Washington Mio. Learning Metrics for Shape Classification and Discrimination. In 20th International Conference on Pattern Recognition, ICPR 2010, Istanbul, Turkey, 23-26 August 2010. pages 2652-2655, IEEE, 2010. [doi]
@inproceedings{FanHM10,
title = {Learning Metrics for Shape Classification and Discrimination},
author = {Yu Fan and David Houle and Washington Mio},
year = {2010},
doi = {10.1109/ICPR.2010.650},
url = {http://dx.doi.org/10.1109/ICPR.2010.650},
tags = {classification},
researchr = {https://researchr.org/publication/FanHM10},
cites = {0},
citedby = {0},
pages = {2652-2655},
booktitle = {20th International Conference on Pattern Recognition, ICPR 2010, Istanbul, Turkey, 23-26 August 2010},
publisher = {IEEE},
}