Chih-Min Fan, Yun-Pei Lu. A Bayesian Ranking Scheme for supporting cost-effective yield diagnosis services. In IEEE Conference on Automation Science and Engineering, CASE 2009, Bangalore, India, 22-25 August, 2011. pages 427-432, IEEE, 2009. [doi]
@inproceedings{FanL09-4,
title = {A Bayesian Ranking Scheme for supporting cost-effective yield diagnosis services},
author = {Chih-Min Fan and Yun-Pei Lu},
year = {2009},
doi = {10.1109/COASE.2009.5234101},
url = {http://dx.doi.org/10.1109/COASE.2009.5234101},
researchr = {https://researchr.org/publication/FanL09-4},
cites = {0},
citedby = {0},
pages = {427-432},
booktitle = {IEEE Conference on Automation Science and Engineering, CASE 2009, Bangalore, India, 22-25 August, 2011},
publisher = {IEEE},
isbn = {978-1-4244-4578-3},
}