Hongxia Fang, Krishnendu Chakrabarty, Hideo Fujiwara. RTL DFT techniques to enhance defect coverage for functional test sequences. In IEEE International High Level Design Validation and Test Workshop, HLDVT 2009, San Francisco, CA, USA, 4-6 November 2009. pages 160-165, IEEE, 2009. [doi]
@inproceedings{FangCF09-0,
title = {RTL DFT techniques to enhance defect coverage for functional test sequences},
author = {Hongxia Fang and Krishnendu Chakrabarty and Hideo Fujiwara},
year = {2009},
doi = {10.1109/HLDVT.2009.5340161},
url = {http://dx.doi.org/10.1109/HLDVT.2009.5340161},
researchr = {https://researchr.org/publication/FangCF09-0},
cites = {0},
citedby = {0},
pages = {160-165},
booktitle = {IEEE International High Level Design Validation and Test Workshop, HLDVT 2009, San Francisco, CA, USA, 4-6 November 2009},
publisher = {IEEE},
}