Paolo Fantini, Giorgio Ferrari. Low frequency noise and technology induced mechanical stress in MOSFETs. Microelectronics Reliability, 47(8):1218-1221, 2007. [doi]
@article{FantiniF07,
title = {Low frequency noise and technology induced mechanical stress in MOSFETs},
author = {Paolo Fantini and Giorgio Ferrari},
year = {2007},
doi = {10.1016/j.microrel.2006.09.024},
url = {http://dx.doi.org/10.1016/j.microrel.2006.09.024},
researchr = {https://researchr.org/publication/FantiniF07},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {47},
number = {8},
pages = {1218-1221},
}