Farimah Farahmandi, Prabhat Mishra. Automated Test Generation for Debugging Multiple Bugs in Arithmetic Circuits. IEEE Transactions on Computers, 68(2):182-197, 2019. [doi]
@article{FarahmandiM19,
title = {Automated Test Generation for Debugging Multiple Bugs in Arithmetic Circuits},
author = {Farimah Farahmandi and Prabhat Mishra},
year = {2019},
doi = {10.1109/TC.2018.2868362},
url = {https://doi.org/10.1109/TC.2018.2868362},
researchr = {https://researchr.org/publication/FarahmandiM19},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Computers},
volume = {68},
number = {2},
pages = {182-197},
}