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Data mining diagnostics and bug MRIs for HW bug localization

Monica Farkash, Bryan G. Hickerson, Balavinayagam Samynathan. Data mining diagnostics and bug MRIs for HW bug localization. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 79-84, ACM, 2015. [doi]

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Monica Farkash

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Bryan G. Hickerson

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Balavinayagam Samynathan

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