Asad Fayyaz, Besar Asllani, Alberto Castellazzi, Michele Riccio, Andrea Irace. Avalanche ruggedness of parallel SiC power MOSFETs. Microelectronics Reliability, 88:666-670, 2018. [doi]
@article{FayyazACRI18,
title = {Avalanche ruggedness of parallel SiC power MOSFETs},
author = {Asad Fayyaz and Besar Asllani and Alberto Castellazzi and Michele Riccio and Andrea Irace},
year = {2018},
doi = {10.1016/j.microrel.2018.06.038},
url = {https://doi.org/10.1016/j.microrel.2018.06.038},
researchr = {https://researchr.org/publication/FayyazACRI18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {88},
pages = {666-670},
}