Chi Fei, Bin Liu, Nenghai Yu. Extracting Sift Keypoints in DCT Domain. In Second IEEE International Conference on Data Science in Cyberspace, DSC 2017, Shenzhen, China, June 26-29, 2017. pages 98-101, IEEE Computer Society, 2017. [doi]
@inproceedings{FeiLY17, title = {Extracting Sift Keypoints in DCT Domain}, author = {Chi Fei and Bin Liu and Nenghai Yu}, year = {2017}, doi = {10.1109/DSC.2017.56}, url = {http://doi.ieeecomputersociety.org/10.1109/DSC.2017.56}, researchr = {https://researchr.org/publication/FeiLY17}, cites = {0}, citedby = {0}, pages = {98-101}, booktitle = {Second IEEE International Conference on Data Science in Cyberspace, DSC 2017, Shenzhen, China, June 26-29, 2017}, publisher = {IEEE Computer Society}, isbn = {978-1-5386-1600-0}, }