Xuan Feng, Shurong Dong, Hei Wong, Danqun Yu, Kin Leong Pey, Kalya Shubhakar, W. S. Lau. 2 stack. Microelectronics Reliability, 61:78-81, 2016. [doi]
@article{FengDWYPSL16,
title = {2 stack},
author = {Xuan Feng and Shurong Dong and Hei Wong and Danqun Yu and Kin Leong Pey and Kalya Shubhakar and W. S. Lau},
year = {2016},
doi = {10.1016/j.microrel.2016.02.012},
url = {http://dx.doi.org/10.1016/j.microrel.2016.02.012},
researchr = {https://researchr.org/publication/FengDWYPSL16},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {61},
pages = {78-81},
}