Tao Feng, Noh-Jin Park, Minsu Choi, Nohpill Park. Reliability Modeling and Analysis of Clockless Wave Pipeline Core for Embedded Combinational Logic Design. IEEE T. Instrumentation and Measurement, 59(7):1812-1824, 2010. [doi]
@article{FengPCP10,
title = {Reliability Modeling and Analysis of Clockless Wave Pipeline Core for Embedded Combinational Logic Design},
author = {Tao Feng and Noh-Jin Park and Minsu Choi and Nohpill Park},
year = {2010},
doi = {10.1109/TIM.2009.2030917},
url = {http://dx.doi.org/10.1109/TIM.2009.2030917},
tags = {modeling, analysis, logic, reliability, design},
researchr = {https://researchr.org/publication/FengPCP10},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {59},
number = {7},
pages = {1812-1824},
}