Supervised Pun Detection and Location with Feature Engineering and Logistic Regression

Jingyuan Feng, Özge Sevgili, Steffen Remus, Eugen Ruppert, Chris Biemann. Supervised Pun Detection and Location with Feature Engineering and Logistic Regression. In Sarah Ebling, Don Tuggener, Manuela Hürlimann, Mark Cieliebak, Martin Volk 0001, editors, Proceedings of the 5th Swiss Text Analytics Conference and the 16th Conference on Natural Language Processing, SwissText/KONVENS 2020, Zurich, Switzerland, June 23-25, 2020 [online only]. Volume 2624 of CEUR Workshop Proceedings, CEUR-WS.org, 2020. [doi]

@inproceedings{FengSRRB20,
  title = {Supervised Pun Detection and Location with Feature Engineering and Logistic Regression},
  author = {Jingyuan Feng and Özge Sevgili and Steffen Remus and Eugen Ruppert and Chris Biemann},
  year = {2020},
  url = {http://ceur-ws.org/Vol-2624/paper3.pdf},
  researchr = {https://researchr.org/publication/FengSRRB20},
  cites = {0},
  citedby = {0},
  booktitle = {Proceedings of the 5th Swiss Text Analytics Conference and the 16th Conference on Natural Language Processing, SwissText/KONVENS 2020, Zurich, Switzerland, June 23-25, 2020 [online only]},
  editor = {Sarah Ebling and Don Tuggener and Manuela Hürlimann and Mark Cieliebak and Martin Volk 0001},
  volume = {2624},
  series = {CEUR Workshop Proceedings},
  publisher = {CEUR-WS.org},
}