Md Meftahul Ferdaus, Bangjian Zhou, Ji Wei Yoon, Kain Lu Low, Jieming Pan, Joydeep Ghosh, Min Wu 0008, Xiaoli Li 0001, Aaron Voon-Yew Thean, J. Senthilnath 0001. Significance of activation functions in developing an online classifier for semiconductor defect detection. Knowl.-Based Syst., 248:108818, 2022. [doi]
@article{FerdausZYLPGWLT22,
title = {Significance of activation functions in developing an online classifier for semiconductor defect detection},
author = {Md Meftahul Ferdaus and Bangjian Zhou and Ji Wei Yoon and Kain Lu Low and Jieming Pan and Joydeep Ghosh and Min Wu 0008 and Xiaoli Li 0001 and Aaron Voon-Yew Thean and J. Senthilnath 0001},
year = {2022},
doi = {10.1016/j.knosys.2022.108818},
url = {https://doi.org/10.1016/j.knosys.2022.108818},
researchr = {https://researchr.org/publication/FerdausZYLPGWLT22},
cites = {0},
citedby = {0},
journal = {Knowl.-Based Syst.},
volume = {248},
pages = {108818},
}