On estimating bounds of the quiescent current for I/sub DDQ/ testin

Antoni Ferré, Joan Figueras. On estimating bounds of the quiescent current for I/sub DDQ/ testin. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 106-111, IEEE Computer Society, 1996. [doi]

Authors

Antoni Ferré

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Joan Figueras

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