Error-Related EEG Potentials Generated During Simulated Brain-Computer Interaction

Pierre W. Ferrez, José del R. Millán. Error-Related EEG Potentials Generated During Simulated Brain-Computer Interaction. IEEE Trans. Biomed. Engineering, 55(3):923-929, 2008. [doi]

Authors

Pierre W. Ferrez

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José del R. Millán

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