Christian Fibich, Martin Horauer, Roman Obermaisser. Vulnerability analysis of storage elements in HLS-generated designs using high-level profiling. In 2nd International Conference on System Reliability and Safety, ICSRS 2017, Milan, Italy, December 20-22, 2017. pages 190-194, IEEE, 2017. [doi]
@inproceedings{FibichHO17-0,
title = {Vulnerability analysis of storage elements in HLS-generated designs using high-level profiling},
author = {Christian Fibich and Martin Horauer and Roman Obermaisser},
year = {2017},
doi = {10.1109/ICSRS.2017.8272819},
url = {https://doi.org/10.1109/ICSRS.2017.8272819},
researchr = {https://researchr.org/publication/FibichHO17-0},
cites = {0},
citedby = {0},
pages = {190-194},
booktitle = {2nd International Conference on System Reliability and Safety, ICSRS 2017, Milan, Italy, December 20-22, 2017},
publisher = {IEEE},
isbn = {978-1-5386-3322-9},
}