Peter Filter, Hana Kubatova. Improvement of the Fault Coverage of the Pseudo-Random Phase in Column-Matching BIST. In Eighth Euromicro Symposium on Digital Systems Design (DSD 2005), 30 August - 3 September 2005, Porto, Portugal. pages 56-63, IEEE Computer Society, 2005. [doi]
@inproceedings{FilterK05,
title = {Improvement of the Fault Coverage of the Pseudo-Random Phase in Column-Matching BIST},
author = {Peter Filter and Hana Kubatova},
year = {2005},
doi = {10.1109/DSD.2005.51},
url = {http://doi.ieeecomputersociety.org/10.1109/DSD.2005.51},
tags = {coverage},
researchr = {https://researchr.org/publication/FilterK05},
cites = {0},
citedby = {0},
pages = {56-63},
booktitle = {Eighth Euromicro Symposium on Digital Systems Design (DSD 2005), 30 August - 3 September 2005, Porto, Portugal},
publisher = {IEEE Computer Society},
isbn = {0-7695-2433-8},
}