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Alessandro Fin, Franco Fummi. Protected IP-core test generation. In Kanad Ghose, Patrick H. Madden, Vivek De, Peter M. Kogge, editors, Proceedings of the 12th ACM Great Lakes Symposium on VLSI 2002, New York, NY, USA, April 18-19, 2002. pages 59-64, ACM, 2002. [doi]

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