Farshad Firouzi, Amir Yazdanbakhsh, Hamed Dorosti, Sied Mehdi Fakhraie. Dynamic Soft Error Hardening via Joint Body Biasing and Dynamic Voltage Scaling. In 14th Euromicro Conference on Digital System Design, Architectures, Methods and Tools, DSD 2011, August 31 - September 2, 2011, Oulu, Finland. pages 385-392, IEEE, 2011. [doi]
@inproceedings{FirouziYDF11,
title = {Dynamic Soft Error Hardening via Joint Body Biasing and Dynamic Voltage Scaling},
author = {Farshad Firouzi and Amir Yazdanbakhsh and Hamed Dorosti and Sied Mehdi Fakhraie},
year = {2011},
doi = {10.1109/DSD.2011.53},
url = {http://doi.ieeecomputersociety.org/10.1109/DSD.2011.53},
researchr = {https://researchr.org/publication/FirouziYDF11},
cites = {0},
citedby = {0},
pages = {385-392},
booktitle = {14th Euromicro Conference on Digital System Design, Architectures, Methods and Tools, DSD 2011, August 31 - September 2, 2011, Oulu, Finland},
publisher = {IEEE},
isbn = {978-1-4577-1048-3},
}