A new approach for testing artificial neural networks

C. A. Fleischer, Lee A. Belfore II. A new approach for testing artificial neural networks. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 245-251, IEEE Computer Society, 1997. [doi]

@inproceedings{FleischerB97,
  title = {A new approach for testing artificial neural networks},
  author = {C. A. Fleischer and Lee A. Belfore II},
  year = {1997},
  url = {http://csdl.computer.org/comp/proceedings/vts/1997/7810/00/78100245abs.htm},
  tags = {testing, C++, systematic-approach},
  researchr = {https://researchr.org/publication/FleischerB97},
  cites = {0},
  citedby = {0},
  pages = {245-251},
  booktitle = {15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA},
  publisher = {IEEE Computer Society},
}