Franck Fleurey, Yves Le Traon, Benoit Baudry. From Testing to Diagnosis: An Automated Approach. In 19th IEEE International Conference on Automated Software Engineering (ASE 2004), 20-25 September 2004, Linz, Austria. pages 306-309, IEEE Computer Society, 2004. [doi]
@inproceedings{FleureyTB04,
title = {From Testing to Diagnosis: An Automated Approach},
author = {Franck Fleurey and Yves Le Traon and Benoit Baudry},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/ase/2004/2131/00/21310306abs.htm},
tags = {testing, systematic-approach},
researchr = {https://researchr.org/publication/FleureyTB04},
cites = {0},
citedby = {0},
pages = {306-309},
booktitle = {19th IEEE International Conference on Automated Software Engineering (ASE 2004), 20-25 September 2004, Linz, Austria},
publisher = {IEEE Computer Society},
isbn = {0-7695-2131-2},
}