Power-Constrained Test Scheduling for SoCs Under a no session Scheme

Marie-Lise Flottes, Julien Pouget, Bruno Rouzeyre. Power-Constrained Test Scheduling for SoCs Under a no session Scheme. In Michel Robert, Bruno Rouzeyre, Christian Piguet, Marie-Lise Flottes, editors, SOC Design Methodologies, IFIP TC10/WG10.5 Eleventh International Conference on Very Large Scale Integration of Systems-on/Chip (VLSI-SOC 01), December 3-5, 2001, Montpellier, France. Volume 218 of IFIP Conference Proceedings, pages 401-412, Kluwer, 2001.

@inproceedings{FlottesPR01,
  title = {Power-Constrained Test Scheduling for SoCs Under a  no session  Scheme},
  author = {Marie-Lise Flottes and Julien Pouget and Bruno Rouzeyre},
  year = {2001},
  tags = {testing},
  researchr = {https://researchr.org/publication/FlottesPR01},
  cites = {0},
  citedby = {0},
  pages = {401-412},
  booktitle = {SOC Design Methodologies, IFIP TC10/WG10.5 Eleventh International Conference on Very Large Scale Integration of Systems-on/Chip (VLSI-SOC 01), December 3-5, 2001, Montpellier, France},
  editor = {Michel Robert and Bruno Rouzeyre and Christian Piguet and Marie-Lise Flottes},
  volume = {218},
  series = {IFIP Conference Proceedings},
  publisher = {Kluwer},
  isbn = {1-4020-7148-5},
}