Improving the scan statistic to design sensor detection systems

Benedito J. B. Fonseca Jr.. Improving the scan statistic to design sensor detection systems. In 2016 IEEE Sensor Array and Multichannel Signal Processing Workshop (SAM), Rio de Janerio, Brazil, July 10-13, 2016. pages 1-5, IEEE, 2016. [doi]

Authors

Benedito J. B. Fonseca Jr.

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