Life margin assessment with Physics of Failure Tools application to BGA packages

B. Foucher, J. Tomas, F. Mounsi, M. Jeremias. Life margin assessment with Physics of Failure Tools application to BGA packages. Microelectronics Reliability, 46(5-6):1013-1018, 2006. [doi]

Authors

B. Foucher

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J. Tomas

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F. Mounsi

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M. Jeremias

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