Tony Fountain, Thomas G. Dietterich, Bill Sudyka. Mining IC test data to optimize VLSI testing. In KDD. pages 18-25, 2000. [doi]
@inproceedings{FountainDS00,
title = {Mining IC test data to optimize VLSI testing},
author = {Tony Fountain and Thomas G. Dietterich and Bill Sudyka},
year = {2000},
doi = {10.1145/347090.347099},
url = {http://doi.acm.org/10.1145/347090.347099},
tags = {optimization, testing, data-flow},
researchr = {https://researchr.org/publication/FountainDS00},
cites = {0},
citedby = {0},
pages = {18-25},
booktitle = {KDD},
}