Yield and reliability issues in nanoelectronic technologies

Denis Teixeira Franco, Jean-François Naviner, Lirida A. B. Naviner. Yield and reliability issues in nanoelectronic technologies. Annales des Télécommunications, 61(11-12):1422-1457, 2006. [doi]

Authors

Denis Teixeira Franco

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Jean-François Naviner

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Lirida A. B. Naviner

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