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Electrical resistance tomography with voltage excitation

Marco A. Rodriguez Frias, Wuqiang Yang. Electrical resistance tomography with voltage excitation. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016, Proceedings, Taipei, Taiwan, May 23-26, 2016. pages 1-6, IEEE, 2016. [doi]

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Marco A. Rodriguez Frias

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Wuqiang Yang

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