Zachary P. Fry, Westley. Clustering static analysis defect reports to reduce maintenance costs. In Ralf Lämmel, Rocco Oliveto, Romain Robbes, editors, 20th Working Conference on Reverse Engineering, WCRE 2013, Koblenz, Germany, October 14-17, 2013. pages 282-291, IEEE, 2013. [doi]
@inproceedings{FryW13-0,
title = {Clustering static analysis defect reports to reduce maintenance costs},
author = {Zachary P. Fry and Westley},
year = {2013},
doi = {10.1109/WCRE.2013.6671303},
url = {http://doi.ieeecomputersociety.org/10.1109/WCRE.2013.6671303},
researchr = {https://researchr.org/publication/FryW13-0},
cites = {0},
citedby = {0},
pages = {282-291},
booktitle = {20th Working Conference on Reverse Engineering, WCRE 2013, Koblenz, Germany, October 14-17, 2013},
editor = {Ralf Lämmel and Rocco Oliveto and Romain Robbes},
publisher = {IEEE},
}