Error control combining Hamming and product codes for energy efficient nanoscale on-chip interconnects

Bo Fu, Paul Ampadu. Error control combining Hamming and product codes for energy efficient nanoscale on-chip interconnects. IET Computers & Digital Techniques, 4(3):251-261, 2010. [doi]

@article{FuA10-0,
  title = {Error control combining Hamming and product codes for energy efficient nanoscale on-chip interconnects},
  author = {Bo Fu and Paul Ampadu},
  year = {2010},
  doi = {10.1049/iet-cdt.2008.0130},
  url = {http://dx.doi.org/10.1049/iet-cdt.2008.0130},
  researchr = {https://researchr.org/publication/FuA10-0},
  cites = {0},
  citedby = {0},
  journal = {IET Computers & Digital Techniques},
  volume = {4},
  number = {3},
  pages = {251-261},
}