Fault Detection of Electrical Yield Meter Based on Electrical Resistance Tomography

Keyi Fu, Shihong Yue, Donghua Luo, Liping Liu. Fault Detection of Electrical Yield Meter Based on Electrical Resistance Tomography. IEEE Access, 12:158103-158109, 2024. [doi]

Authors

Keyi Fu

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Shihong Yue

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Donghua Luo

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Liping Liu

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