Thomas E. Fuja, Chris Heegard. Row/Column Replacement for the Control of Hard Defects in Semiconductor RAM s. IEEE Transactions on Computers, 35(11):996-1000, 1986.
@article{FujaH86,
title = {Row/Column Replacement for the Control of Hard Defects in Semiconductor RAM s},
author = {Thomas E. Fuja and Chris Heegard},
year = {1986},
tags = {e-science},
researchr = {https://researchr.org/publication/FujaH86},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Computers},
volume = {35},
number = {11},
pages = {996-1000},
}