Robert H. Fujii, Jacob A. Abraham. Approaches to Circuit Level Design for Testability. In Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986. pages 480-483, IEEE Computer Society, 1986.
@inproceedings{FujiiA86,
title = {Approaches to Circuit Level Design for Testability},
author = {Robert H. Fujii and Jacob A. Abraham},
year = {1986},
tags = {testing, design, systematic-approach},
researchr = {https://researchr.org/publication/FujiiA86},
cites = {0},
citedby = {0},
pages = {480-483},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986},
publisher = {IEEE Computer Society},
}