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A Test Scenario Generation Method for High Requirement Coverage by using KAOS Method

Toshiyuki Fujikura, Ryo Kurachi. A Test Scenario Generation Method for High Requirement Coverage by using KAOS Method. In 19th IEEE International Conference on Software Quality, Reliability and Security Companion, QRS Companion 2019, Sofia, Bulgaria, July 22-26, 2019. pages 542-543, IEEE, 2019. [doi]

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Toshiyuki Fujikura

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Ryo Kurachi

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