Mitsushiro Fujishima, Shinobu Ueda, Hisato Yoneda, Takashi Yoshizawa, Akio Ito, Tetsuo Takeuchi, Shinichiro Chino, Kenji Kitayama, Toshio Ono, Takashi Matsukuma, Hiroshi Yoshida, Makoto Okuda, Kenji Kumagai. A new methodology for providing insight into manufacturing using KPIs based on SMKL (Smart Manufacturing Kaizen Level), utilizing industry standards (OPC UA, FDT, PLCopen and AutomationML). In 59th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2020, Chiang Mai, Thailand, September 23-26, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{FujishimaUYYITC20,
title = {A new methodology for providing insight into manufacturing using KPIs based on SMKL (Smart Manufacturing Kaizen Level), utilizing industry standards (OPC UA, FDT, PLCopen and AutomationML)},
author = {Mitsushiro Fujishima and Shinobu Ueda and Hisato Yoneda and Takashi Yoshizawa and Akio Ito and Tetsuo Takeuchi and Shinichiro Chino and Kenji Kitayama and Toshio Ono and Takashi Matsukuma and Hiroshi Yoshida and Makoto Okuda and Kenji Kumagai},
year = {2020},
url = {https://ieeexplore.ieee.org/document/9240274},
researchr = {https://researchr.org/publication/FujishimaUYYITC20},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {59th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2020, Chiang Mai, Thailand, September 23-26, 2020},
publisher = {IEEE},
isbn = {978-1-7281-1089-9},
}