Kosuke Fujita, Fumiya Kinoshita, Hideaki Touyama. Detection of Cognitive Decline Due to Mental Fatigue Using Electroencephalogram. In IEEE International Conference on Systems, Man, and Cybernetics, SMC 2018, Miyazaki, Japan, October 7-10, 2018. pages 562-567, IEEE, 2018. [doi]
@inproceedings{FujitaKT18,
title = {Detection of Cognitive Decline Due to Mental Fatigue Using Electroencephalogram},
author = {Kosuke Fujita and Fumiya Kinoshita and Hideaki Touyama},
year = {2018},
doi = {10.1109/SMC.2018.00105},
url = {https://doi.org/10.1109/SMC.2018.00105},
researchr = {https://researchr.org/publication/FujitaKT18},
cites = {0},
citedby = {0},
pages = {562-567},
booktitle = {IEEE International Conference on Systems, Man, and Cybernetics, SMC 2018, Miyazaki, Japan, October 7-10, 2018},
publisher = {IEEE},
isbn = {978-1-5386-6650-0},
}