Yuto Fujita, Kiyoshi Ueda. A Method for Selecting Training Data Using Doc2Vec for Automatic Test Cases Generation. In IEEE International Conference on Consumer Electronics, ICCE 2024, Las Vegas, NV, USA, January 6-8, 2024. pages 1-6, IEEE, 2024. [doi]
@inproceedings{FujitaU24,
title = {A Method for Selecting Training Data Using Doc2Vec for Automatic Test Cases Generation},
author = {Yuto Fujita and Kiyoshi Ueda},
year = {2024},
doi = {10.1109/ICCE59016.2024.10444275},
url = {https://doi.org/10.1109/ICCE59016.2024.10444275},
researchr = {https://researchr.org/publication/FujitaU24},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Conference on Consumer Electronics, ICCE 2024, Las Vegas, NV, USA, January 6-8, 2024},
publisher = {IEEE},
isbn = {979-8-3503-2413-6},
}