Motoki Fukusima, Akio Ohta, Katsunori Makihara, Seiichi Miyazaki. Characterization of Resistive Switching of Pt/Si-Rich Oxide/TiN System. IEICE Transactions, 96-C(5):708-713, 2013. [doi]
@article{FukusimaOMM13,
title = {Characterization of Resistive Switching of Pt/Si-Rich Oxide/TiN System},
author = {Motoki Fukusima and Akio Ohta and Katsunori Makihara and Seiichi Miyazaki},
year = {2013},
url = {http://search.ieice.org/bin/summary.php?id=e96-c_5_708},
researchr = {https://researchr.org/publication/FukusimaOMM13},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {96-C},
number = {5},
pages = {708-713},
}