Design for testability in a silicon compilation environment

H. S. Fung, S. Hirschhorn, R. Kulkarni. Design for testability in a silicon compilation environment. In Hillel Ofek, Lawrence A. O Neill, editors, Proceedings of the 22nd ACM/IEEE conference on Design automation, DAC 1985, Las Vegas, Nevada, USA. pages 190-196, ACM, 1985. [doi]

@inproceedings{FungHK85,
  title = {Design for testability in a silicon compilation environment},
  author = {H. S. Fung and S. Hirschhorn and R. Kulkarni},
  year = {1985},
  doi = {10.1145/317825.317857},
  url = {http://doi.acm.org/10.1145/317825.317857},
  tags = {meta-model, testing, Meta-Environment, design, meta-objects},
  researchr = {https://researchr.org/publication/FungHK85},
  cites = {0},
  citedby = {0},
  pages = {190-196},
  booktitle = {Proceedings of the 22nd ACM/IEEE conference on Design automation, DAC 1985, Las Vegas, Nevada, USA},
  editor = {Hillel Ofek and Lawrence A. O Neill},
  publisher = {ACM},
  isbn = {0-8186-0635-5},
}