H. S. Fung, S. Hirschhorn, R. Kulkarni. Design for testability in a silicon compilation environment. In Hillel Ofek, Lawrence A. O Neill, editors, Proceedings of the 22nd ACM/IEEE conference on Design automation, DAC 1985, Las Vegas, Nevada, USA. pages 190-196, ACM, 1985. [doi]
@inproceedings{FungHK85, title = {Design for testability in a silicon compilation environment}, author = {H. S. Fung and S. Hirschhorn and R. Kulkarni}, year = {1985}, doi = {10.1145/317825.317857}, url = {http://doi.acm.org/10.1145/317825.317857}, tags = {meta-model, testing, Meta-Environment, design, meta-objects}, researchr = {https://researchr.org/publication/FungHK85}, cites = {0}, citedby = {0}, pages = {190-196}, booktitle = {Proceedings of the 22nd ACM/IEEE conference on Design automation, DAC 1985, Las Vegas, Nevada, USA}, editor = {Hillel Ofek and Lawrence A. O Neill}, publisher = {ACM}, isbn = {0-8186-0635-5}, }