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Characterization of Electron Field Emission from Multiple-Stacking Si-Based Quantum Dots

Yuto Futamura, Katsunori Makihara, Akio Ohta, Mitsuhisa Ikeda, Seiichi Miyazaki. Characterization of Electron Field Emission from Multiple-Stacking Si-Based Quantum Dots. IEICE Transactions, 102-C(6):458-461, 2019. [doi]

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